Personal profile
Biography
Dr. Limbrick is an Associate Professor in the Electrical and Computer Engineering Department at NC A&T. As a postdoctoral fellow at the Georgia Institute of Technology, he researched methods to improve routing congestion in monolithic 3D integrated circuits with Dr. Sung Kyu Lim. As a doctoral student, Dr. Limbrick was a member of the Radiation Effects and Reliability (RER) Group and the Security And Fault Tolerance (SAF-T) Research Group, where his research was conducted under the advisement of Dr. William H. Robinson. He received a BS degree in Electrical Engineering at Texas A&M and his MS degree and Ph.D. degree at Vanderbilt University.
Education/Academic qualification
Electrical Engineering, Ph.D., Vanderbilt University
… → 2012
Electrical Engineering, M.S., Vanderbilt University
… → 2009
Electrical Engineering, BS, N/A, Texas A&M University
… → 2007
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Athena – The NSF AI Institute for Edge Computing
Chen, Y., Banerjee, S., Daily, S., Krolik, J., Li, H., Limbrick, D., Pajic, M., Runton, R. & Zhong, L., Mar 1 2024, In: AI Magazine. 45, 1, p. 15-21 7 p.Research output: Contribution to journal › Article › peer-review
Open Access -
Single Event Transient Pulse Width Characterization and Analysis of Basic Skywater 130-nm Logic Gates
Aravind, J. & Limbrick, D. B., 2024, (Accepted/In press) Unknown book.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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A Survey of QEMU-Based Fault Injection Tools & Techniques for Emulating Physical Faults
Bekele, Y. B., Limbrick, D. B. & Kelly, J. C., Jan 1 2023, In: IEEE Access. 11, p. 62662-62673 12 p.Research output: Contribution to journal › Review article › peer-review
Open Access7 Scopus citations -
Evaluating the Impact of Hardware Faults on Program Execution in a Microkernel Environment
Bekele, Y. & Limbrick, D. B., 2022, Unknown book.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Single Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies
Olowogemo, S. A., Lin, B.-T., Qiu, H., Robinson, W. H. & Limbrick, D. B., 2022, Unknown book.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Service
- 24 Professional Service
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University Partnership Program Manager
Limbrick, D. (Participant)
2020 → …Activity: Other › Professional Service
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