Scholarship and Creative Expressions per year
Scholarship and Creative Expressions per year
Personal profile
Biography
Dr. Limbrick is an Associate Professor in the Electrical and Computer Engineering Department at NC A&T. As a postdoctoral fellow at the Georgia Institute of Technology, he researched methods to improve routing congestion in monolithic 3D integrated circuits with Dr. Sung Kyu Lim. As a doctoral student, Dr. Limbrick was a member of the Radiation Effects and Reliability (RER) Group and the Security And Fault Tolerance (SAF-T) Research Group, where his research was conducted under the advisement of Dr. William H. Robinson. He received a BS degree in Electrical Engineering at Texas A&M and his MS degree and Ph.D. degree at Vanderbilt University.
Education/Academic qualification
Electrical Engineering, Ph.D., Vanderbilt University
… → 2012
Electrical Engineering, M.S., Vanderbilt University
… → 2009
Electrical Engineering, BS, N/A, Texas A&M University
… → 2007
Fingerprint
Dive into the research topics where Daniel Limbrick is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
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Athena – The NSF AI Institute for Edge Computing
Chen, Y., Banerjee, S., Daily, S., Krolik, J., Li, H., Limbrick, D., Pajic, M., Runton, R. & Zhong, L., 2024, In: AI Magazine. 45, Issue 1Research output: Contribution to journal › Article
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Single Event Transient Pulse Width Characterization and Analysis of Basic Skywater 130-nm Logic Gates
Aravind, J. & Limbrick, D., 2024, (Accepted/In press) Unknown book.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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A Survey of QEMU-based Fault Injection Tools & Techniques for Emulating Physical Faults
Bekele, Y., Limbrick, D. & Kelly, J., 2023, In: IEEE Access.Research output: Contribution to journal › Article
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Evaluating the Impact of Hardware Faults on Program Execution in a Microkernel Environment
Bekele, Y. & Limbrick, D., 2022, Unknown book.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Single Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies
Olowogemo, S. A., Lin, B.-T., Qiu, H., Robinson, W. H. & Limbrick, D., 2022, Unknown book.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Service
- 24 Professional Service
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University Partnership Program Manager
Limbrick, D. (Participant)
2020 → …Activity: Other › Professional Service
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Teaching
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Data Science Essential
Raptis, I., Karimoddini, A., Homaifar, A., Graves, C., Limbrick, D. & Yang, B. 01/1/23 → …
Course
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