A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection
- Nana Kankam Gyimah
- , Abenezer Girma
- , Mahmoud Nabil Mahmoud
- , Shamila Nateghi
- , Abdollah Homaifar
- , Daniel Opoku
- North Carolina at State University
- Kwame Nkrumah University of Science and Technology
Research output: Contribution to journal › Conference article › peer-review
29
Scopus
citations