Design-based variability in simulating single event transients

William H. Robinson; Daniel B. Limbrick; Bradley T. Kiddie; Ahmed I. Abdul-Rahman; Bor Tyng Lin; Semiu A. Olowogemo

doi:10.1109/radecs.2016.8093200

Design-based variability in simulating single event transients

William H. Robinson
, Daniel B. Limbrick
, Bradley T. Kiddie
, Ahmed I. Abdul-Rahman
, Bor Tyng Lin
, Semiu A. Olowogemo

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Accurate analysis of single event transients requires benchmarks that incorporate physical design of circuits to capture charge sharing effects. This paper provides case studies to show how design variability impacts single event transient simulations.

Original language	English
Title of host publication	16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
Volume	2016-
DOIs	https://doi.org/10.1109/radecs.2016.8093200
State	Published - 2017

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@inproceedings{12471d9ddb994772bdaf87ca871c74ea,

title = "Design-based variability in simulating single event transients",

abstract = "Accurate analysis of single event transients requires benchmarks that incorporate physical design of circuits to capture charge sharing effects. This paper provides case studies to show how design variability impacts single event transient simulations.",

author = "Robinson, \{William H.\} and Limbrick, \{Daniel B.\} and Kiddie, \{Bradley T.\} and Abdul-Rahman, \{Ahmed I.\} and Lin, \{Bor Tyng\} and Olowogemo, \{Semiu A.\}",

year = "2017",

doi = "10.1109/radecs.2016.8093200",

language = "English",

volume = "2016-",

booktitle = "16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016",

}

TY - GEN

T1 - Design-based variability in simulating single event transients

AU - Robinson, William H.

AU - Limbrick, Daniel B.

AU - Kiddie, Bradley T.

AU - Abdul-Rahman, Ahmed I.

AU - Lin, Bor Tyng

AU - Olowogemo, Semiu A.

PY - 2017

Y1 - 2017

N2 - Accurate analysis of single event transients requires benchmarks that incorporate physical design of circuits to capture charge sharing effects. This paper provides case studies to show how design variability impacts single event transient simulations.

AB - Accurate analysis of single event transients requires benchmarks that incorporate physical design of circuits to capture charge sharing effects. This paper provides case studies to show how design variability impacts single event transient simulations.

UR - https://dx.doi.org/10.1109/RADECS.2016.8093200

U2 - 10.1109/radecs.2016.8093200

DO - 10.1109/radecs.2016.8093200

M3 - Conference contribution

VL - 2016-

BT - 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016

ER -

Design-based variability in simulating single event transients

Abstract

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