TY - JOUR
T1 - Dynamic allocation of RFID memory across the product life cycle
AU - Stanfield, Paul M
AU - Davis, Lauren
AU - Samanlioglu, Funda
AU - Udoka, Silvanus
PY - 2006/12/1
Y1 - 2006/12/1
N2 - It is anticipated that product life cycle management of durable goods might be significantly improved by the introduction of read/write radio frequency identification (RFID) tags. Such technology significantly expands available life cycle strategies, most notably enabling more distributed decision-making. Progressive collection and tag storage of life cycle data might be particularly useful for later life cycle activities such as product maintenance and disposal. Given fixed data storage capacity and large amounts of candidate life cycle data, the allocation of storage space is of practical concern. This paper presents a conceptual method for RFID memory allocation across the life cycle allowing for dynamic and customizable memory allocation.
AB - It is anticipated that product life cycle management of durable goods might be significantly improved by the introduction of read/write radio frequency identification (RFID) tags. Such technology significantly expands available life cycle strategies, most notably enabling more distributed decision-making. Progressive collection and tag storage of life cycle data might be particularly useful for later life cycle activities such as product maintenance and disposal. Given fixed data storage capacity and large amounts of candidate life cycle data, the allocation of storage space is of practical concern. This paper presents a conceptual method for RFID memory allocation across the life cycle allowing for dynamic and customizable memory allocation.
KW - Life cycle management
KW - Radio Frequency Identification (RFID)
UR - https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=36448932786&origin=inward
UR - https://www.scopus.com/inward/citedby.uri?partnerID=HzOxMe3b&scp=36448932786&origin=inward
M3 - Conference article
SP - 1
JO - 2006 IIE Annual Conference and Exhibition
JF - 2006 IIE Annual Conference and Exhibition
T2 - 2006 IIE Annual Conference and Exposition
Y2 - 20 May 2006 through 24 May 2006
ER -