Effects of photoinduced carrier injection on time-dependent dielectric breakdown

J. M. Atkin; R. B. Laibowitz; T. F. Heinz; J. R. Lloyd; T. M. Shaw; E. Cartier

doi:10.1109/irps.2009.5173365

Effects of photoinduced carrier injection on time-dependent dielectric breakdown

J. M. Atkin
, R. B. Laibowitz
, T. F. Heinz
, J. R. Lloyd
, T. M. Shaw
, E. Cartier

Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Time-dependent dielectric breakdown experiments were performed under broadband UV illumination in order to investigate the effects of increased electron concentration on time to breakdown. Preliminary results show that breakdown can be achieved at shorter time scales and lower fields than in standard reliability tests. ©2009 IEEE.

Original language	English
Title of host publication	2009 IEEE International Reliability Physics Symposium, IRPS 2009
DOIs	https://doi.org/10.1109/irps.2009.5173365
State	Published - 2009

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title = "Effects of photoinduced carrier injection on time-dependent dielectric breakdown",

abstract = "Time-dependent dielectric breakdown experiments were performed under broadband UV illumination in order to investigate the effects of increased electron concentration on time to breakdown. Preliminary results show that breakdown can be achieved at shorter time scales and lower fields than in standard reliability tests. {\textcopyright}2009 IEEE.",

author = "Atkin, \{J. M.\} and Laibowitz, \{R. B.\} and Heinz, \{T. F.\} and Lloyd, \{J. R.\} and Shaw, \{T. M.\} and E. Cartier",

year = "2009",

doi = "10.1109/irps.2009.5173365",

language = "English",

booktitle = "2009 IEEE International Reliability Physics Symposium, IRPS 2009",

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TY - GEN

T1 - Effects of photoinduced carrier injection on time-dependent dielectric breakdown

AU - Atkin, J. M.

AU - Laibowitz, R. B.

AU - Heinz, T. F.

AU - Lloyd, J. R.

AU - Shaw, T. M.

AU - Cartier, E.

PY - 2009

Y1 - 2009

N2 - Time-dependent dielectric breakdown experiments were performed under broadband UV illumination in order to investigate the effects of increased electron concentration on time to breakdown. Preliminary results show that breakdown can be achieved at shorter time scales and lower fields than in standard reliability tests. ©2009 IEEE.

AB - Time-dependent dielectric breakdown experiments were performed under broadband UV illumination in order to investigate the effects of increased electron concentration on time to breakdown. Preliminary results show that breakdown can be achieved at shorter time scales and lower fields than in standard reliability tests. ©2009 IEEE.

UR - https://dx.doi.org/10.1109/IRPS.2009.5173365

U2 - 10.1109/irps.2009.5173365

DO - 10.1109/irps.2009.5173365

M3 - Conference contribution

BT - 2009 IEEE International Reliability Physics Symposium, IRPS 2009

ER -

Effects of photoinduced carrier injection on time-dependent dielectric breakdown

Abstract

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