I-V Characterization of GaAs Sb(N) Single Nanowire using Non-Destructive Technique, Conductive Atomic Force Microscopy (C-AFM)

Research output: Contribution to conference › Paper

Original language	English
State	Published - 2019
Event	Carolina Science Symposium - Duration: Jan 1 2020 → …

Conference	Carolina Science Symposium
Period	01/1/20 → …

Cite this

@conference{b6fe0b0b13b041428fa8551cc0f6fd68,

title = "I-V Characterization of GaAs Sb(N) Single Nanowire using Non-Destructive Technique, Conductive Atomic Force Microscopy (C-AFM)",

author = "Priyanka Ramaswamy and Rabin Pokharel and Shisir Devkota and Surya Nalamati and Li Jia and Iyer, \{Shanthi N\}",

year = "2019",

language = "English",

note = "Carolina Science Symposium ; Conference date: 01-01-2020",

}