TY - JOUR
T1 - Landmark placement for wireless localization in rectangular-shaped industrial facilities
AU - Zhou, Junyi
AU - Shi, Jing
AU - Qu, Xiuli
PY - 2010/7/1
Y1 - 2010/7/1
N2 - Wireless localization is an important application of emerging technologies, e.g., wireless sensor network and radio-frequency identification (RFID). In this paper, the effect of landmark placement on localization performance in rectangularshaped facilities is investigated. The localization performance is evaluated by multiple performance metrics based on the CramerRao lower bound (CRLB), i.e., expected CRLB, probability of lower CRLB, minimum CRLB, and maximum CRLB. Analytical analysis shows that all rectangular landmark layouts have the same minimum CRLB. Numerical results show that the optimal layout in terms of expected CRLB changes with respect to the aspect ratio of facility geometry, which can be predicted by statistical models. The performance on maximum CRLB deteriorates as the aspect ratio of the facility increases. Moreover, the performance in terms of every metric becomes significantly poorer if one landmark fails. Localization experiment based on active RFID devices confirms the findings from both analytical and numerical results. © 2006 IEEE.
AB - Wireless localization is an important application of emerging technologies, e.g., wireless sensor network and radio-frequency identification (RFID). In this paper, the effect of landmark placement on localization performance in rectangularshaped facilities is investigated. The localization performance is evaluated by multiple performance metrics based on the CramerRao lower bound (CRLB), i.e., expected CRLB, probability of lower CRLB, minimum CRLB, and maximum CRLB. Analytical analysis shows that all rectangular landmark layouts have the same minimum CRLB. Numerical results show that the optimal layout in terms of expected CRLB changes with respect to the aspect ratio of facility geometry, which can be predicted by statistical models. The performance on maximum CRLB deteriorates as the aspect ratio of the facility increases. Moreover, the performance in terms of every metric becomes significantly poorer if one landmark fails. Localization experiment based on active RFID devices confirms the findings from both analytical and numerical results. © 2006 IEEE.
KW - CramerRao lower bound (CRLB)
KW - landmark layout
KW - localization
KW - metric
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U2 - 10.1109/TVT.2010.2048765
DO - 10.1109/TVT.2010.2048765
M3 - Article
SN - 0018-9545
VL - 59
SP - 3081
EP - 3090
JO - IEEE Transactions on Vehicular Technology
JF - IEEE Transactions on Vehicular Technology
IS - 6
M1 - 5453006
ER -