Morphological data on soft ferromagnetic Fe90Ta10 thin films

Surabhi Shaji; Nikhil R. Mucha; Svitlana Fialkova; Dhananjay Kumar

doi:10.1016/j.dib.2019.104714

Morphological data on soft ferromagnetic Fe90Ta10 thin films

Surabhi Shaji
, Nikhil R. Mucha
, Svitlana Fialkova
, Dhananjay Kumar

Mechanical Engineering

Industrial and systems engineering with North Carolina A&T State University

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Iron-tantalum (Fe–Ta) thin films were synthesized on silicon (Si) (100) substrates using a pulsed laser deposition (PLD) technique. For the analysis of all reported data, please refer to our main article “Magnetic and electrical properties of Fe90Ta10 thin films [1]”. Morphological data confirm the amorphous nature of the film. Mesokurtic surface of the film was revealed using atomic force microscopy (AFM) analysis. The compositions of target and films were determined using x-ray fluorescence (XRF) data. The composition of Fe–Ta clusters, observed on the film surface, was measured using energy dispersive x-ray (EDX) analysis.

Original language	English
Article number	104714
Journal	Data in Brief
Volume	27
DOIs	https://doi.org/10.1016/j.dib.2019.104714
State	Published - Dec 1 2019

Keywords

Atomic force microscopy
Ferromagnetism
Thin films

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10.1016/j.dib.2019.104714

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title = "Morphological data on soft ferromagnetic Fe90Ta10 thin films",

abstract = "Iron-tantalum (Fe–Ta) thin films were synthesized on silicon (Si) (100) substrates using a pulsed laser deposition (PLD) technique. For the analysis of all reported data, please refer to our main article “Magnetic and electrical properties of Fe90Ta10 thin films [1]”. Morphological data confirm the amorphous nature of the film. Mesokurtic surface of the film was revealed using atomic force microscopy (AFM) analysis. The compositions of target and films were determined using x-ray fluorescence (XRF) data. The composition of Fe–Ta clusters, observed on the film surface, was measured using energy dispersive x-ray (EDX) analysis.",

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doi = "10.1016/j.dib.2019.104714",

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T1 - Morphological data on soft ferromagnetic Fe90Ta10 thin films

AU - Shaji, Surabhi

AU - Mucha, Nikhil R.

AU - Fialkova, Svitlana

AU - Kumar, Dhananjay

PY - 2019/12/1

Y1 - 2019/12/1

N2 - Iron-tantalum (Fe–Ta) thin films were synthesized on silicon (Si) (100) substrates using a pulsed laser deposition (PLD) technique. For the analysis of all reported data, please refer to our main article “Magnetic and electrical properties of Fe90Ta10 thin films [1]”. Morphological data confirm the amorphous nature of the film. Mesokurtic surface of the film was revealed using atomic force microscopy (AFM) analysis. The compositions of target and films were determined using x-ray fluorescence (XRF) data. The composition of Fe–Ta clusters, observed on the film surface, was measured using energy dispersive x-ray (EDX) analysis.

AB - Iron-tantalum (Fe–Ta) thin films were synthesized on silicon (Si) (100) substrates using a pulsed laser deposition (PLD) technique. For the analysis of all reported data, please refer to our main article “Magnetic and electrical properties of Fe90Ta10 thin films [1]”. Morphological data confirm the amorphous nature of the film. Mesokurtic surface of the film was revealed using atomic force microscopy (AFM) analysis. The compositions of target and films were determined using x-ray fluorescence (XRF) data. The composition of Fe–Ta clusters, observed on the film surface, was measured using energy dispersive x-ray (EDX) analysis.

KW - Atomic force microscopy

KW - Ferromagnetism

KW - Thin films

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Morphological data on soft ferromagnetic Fe90Ta10 thin films

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Keywords

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