Abstract
Strategies to mitigate soft errors in combinational logic have resulted in large performance penalties and increases in design time. This study alleviates these issues by using standard cells to selectively harden vulnerable nodes in combinational logic. Results indicate that replacing two-input gates with four-input equivalents reduces pulse widths by 5%-20% with less than 1% power overhead. Additionally, this paper demonstrates reliability gains that can be made at the synthesis level under tight performance constraints. © 2013 IEEE.
| Original language | English |
|---|---|
| Article number | 6464537 |
| Pages (from-to) | 2776-2781 |
| Number of pages | 6 |
| Journal | IEEE Transactions on Nuclear Science |
| Volume | 60 |
| Issue number | 4 |
| DOIs | |
| State | Published - Feb 26 2013 |
Keywords
- Combinational logic
- pulse width
- reliability-aware synthesis
- single event transient
- soft error