Room and Elevated Temperature Fractography of Si sub 3 N sub 4 Tested Under Pure Tension

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	343–353
Journal	ISTFA/88. Proceedings of the International Symposium on Testing and Failure Analysis
State	Published - 1988

Cite this

@article{3b64658741904a1fa2c24375cc536f7e,

title = "Room and Elevated Temperature Fractography of Si sub 3 N sub 4 Tested Under Pure Tension",

author = "Jagannathan Sankar and Ajit Kelkar and A Sinha and R Vaidyanathan",

year = "1988",

language = "English",

pages = "343–353",

journal = "ISTFA/88. Proceedings of the International Symposium on Testing and Failure Analysis",

}

TY - JOUR

T1 - Room and Elevated Temperature Fractography of Si sub 3 N sub 4 Tested Under Pure Tension

AU - Sankar, Jagannathan

AU - Kelkar, Ajit

AU - Sinha, A

AU - Vaidyanathan, R

PY - 1988

Y1 - 1988

M3 - Article

SP - 343

EP - 353

JO - ISTFA/88. Proceedings of the International Symposium on Testing and Failure Analysis

JF - ISTFA/88. Proceedings of the International Symposium on Testing and Failure Analysis

ER -