| Original language | English |
|---|---|
| State | Published - 2015 |
| Event | World Congress on Microscopy 2015 - Duration: Jan 1 2015 → … |
Conference
| Conference | World Congress on Microscopy 2015 |
|---|---|
| Period | 01/1/15 → … |
Scanning Electron Microscopy (SEM) Based Mechanical Characterization of 1-D Nanostructures - Nickel Nanowires
Research output: Contribution to conference › Paper