Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods

Bradley T Kiddie, William H Robinson, Daniel Limbrick

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	60:1 - 60:22
Journal	ACM Trans. Des. Autom. Electron. Syst.
Volume	20
Issue number	4
State	Published - 2015

Cite this

@article{cd2eb8eeb7ae4072a9a38963a41efa75,

title = "Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods",

author = "Kiddie, \{Bradley T\} and Robinson, \{William H\} and Daniel Limbrick",

year = "2015",

language = "English",

volume = "20",

pages = "60:1 -- 60:22",

journal = "ACM Trans. Des. Autom. Electron. Syst.",

number = "4",

}