TY - JOUR
T1 - Virtual design and analysis of nanometer-scale sensor and device components
AU - Brenner, D. W.
AU - Schall, JD
AU - Mewkill, J. P.
AU - Shenderova, O. A.
AU - Sinnott, S. B.
PY - 1998/12/1
Y1 - 1998/12/1
N2 - Four examples of the application of atomistic modeling to the design and analysis of nanometer-scale device components and sensors are discussed. In the first two examples, semiempirical tight-binding electronic structure calculations are used to characterise the electronic properties of uniaxially-strained and chemically-decorated carbon nanotubules. The results are used to suggest possible designs for nanometer-scale strain gauges, vibration sensors, and Schottky diodes. In the second two examples, that are based on variations of scanning-probe microscopy, atomistic simulations are used to explore whether atomic-force microscopy can be used as a probe of surface stress distributions surrounding nanostructures, and whether chemically-reactive tips can be used to pattern surfaces.
AB - Four examples of the application of atomistic modeling to the design and analysis of nanometer-scale device components and sensors are discussed. In the first two examples, semiempirical tight-binding electronic structure calculations are used to characterise the electronic properties of uniaxially-strained and chemically-decorated carbon nanotubules. The results are used to suggest possible designs for nanometer-scale strain gauges, vibration sensors, and Schottky diodes. In the second two examples, that are based on variations of scanning-probe microscopy, atomistic simulations are used to explore whether atomic-force microscopy can be used as a probe of surface stress distributions surrounding nanostructures, and whether chemically-reactive tips can be used to pattern surfaces.
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M3 - Article
SN - 0007-084X
VL - 51
SP - 137
EP - 144
JO - JBIS - Journal of the British Interplanetary Society
JF - JBIS - Journal of the British Interplanetary Society
IS - 4
ER -